Produktai skirti kita šalis gaminių grąžinimo taisyklės (1)

Industry leading automation level Outstanding noise floor and thermal drifts Fast scanner with XYZ lownoise closeloop Routine atomic resolution 60+ SPM modes in basic configuration Continuous zoom from millimeter to nanometer range Integrated with new Atomic Force Microscopy technique HybriD Mode™ Atomic Force Microscope NEXT provides motorized sample positioning and integrated high resolution optical microscope positioning, motorized continuous zoom and focusing of the optical microscope. But AFM automation is more than just motorization. Powerful Nova PX software algorithms remove a gap between optics and AFM providing continuous zoom from huge panoramic optical view down to atomic resolution. Since all step movers are coupled together with the optical image, NEXT provides autofocus, fast oneclick cantilever alignment, panoramic optical view and multiple scanning on 5×5 mm range.Cantilever recognition and automatic laser alignment both in liquid and air Autofocus Measuring heads:AFM and STM (stationary, automatically interchangeable); liquid AFM, and nanosclerometer head Available SPM modes:AFM, STM, nanosclerometry in air environment AFM in liquid environment System of cantilever deflection registration:automated alignment Size:up to 20 mm in diameter, up to 10 mm in height Sample weight:up to 40 g Temperature control:from RT up to 150 oC Type of scanning:by sample Scanning area:100x100x10 um (with feedback sensors) 3x3x2 um in the high resolution mode Nonlinearity, XY:0.1 % (with feedback sensors) Noise XY:less than 0.3 nm (with feedback sensors) Method:automated, video monitored Range, XY:5x5 mm Min. Step:0.3 um Resolution:2 um Focus:motorized Zoom:continuous Sizing:470x210x260 mm Weight:25 kg