Produktai skirti elektronai ir įranga (12)

• 2.4 mm up to 6.4 mm Ø alu and copper • Up to 6 mm Ø steel & 5 mm Ø stainless steel • Up to fl ange diameter 11.4 mm • Rivet body lengths above 30 mm • Traction power up to 11,770 N at 6-7 bar air pressure Productivity and savings potential • Up to 40 blind rivets can be processed every minute • No trained personnel required for operation • Can be easily integrated into fully-automatic production systems • Electronic system controls • Intuitive menu guidance via navigation and function keys • Function display • Maintenance display and simple fault diagnosis • Customer-specifi c software modifi cation is possible • Ideal for applications that do not require any process monitoring • Rivet mandrels are disposed of by vacuum system • Spring loaded trigger system as an optional extra available • Can be integrated into the system or operated independently • Interface for external memory programmable control system (SPS) can be realised via the GESIPA® interface

Gemäß den Spezifikationen unserer Kunden entwickeln, konstruieren und fertigen wir elektronische Baugruppen, Systeme und Geräte.

Auf Grundlage Ihrer Idee entwickeln wir Ihre individuelle Elektronik. Zunächst erarbeiten wir ein Lastenheft, das den Anforderungen an Ihr neues Produkt gerecht wird. Auf Basis dieses Lastenhefts erfolgt die weitere Elektronik Entwicklung. Dabei betreuen wir die komplette Elektronik Entwicklung, vom Prototypen über die Nullserie, bis hin zur Markteinführung.

Die Wälzkolbenpumpen der innovativen HiLobe® Baureihe bieten durch die individuelle Drehzahlregelung einen nominellen Saugvermögensbereich von 520 – 2.100 m3/h und sind somit perfekt auf kundenspezifische Anforderungen abstimmbar. Saugvermögen:520 – 2.100 m3/h Integrale Leckrate:1 · 10-6 Pa m3/s. Nennleistung bei maximaler Drehzahl:2 – 3,5 kW

Voir plus signifie travailler plus vite. Pour faire un balayage rapide de grands composants (jusqu'à 6’’), le DM3 XL fournit un exceptionnel objectif macro. Avec un grossissement de 0,7x, il capture en une fois un champ visuel de 35,7 mm, soit 30 % de plus qu'avec les autres objectifs à balayage conventionnels. Avec l'objectif macro, les défauts n'ont plus aucune chance : Augmenter le rendement Détecter fiablement une insuffisance au bord ou au centre d'une galette Détecter l'inégalité d'épaisseur d'un film radial

All NanoTest stations combines precise measurements with high speed, proven reliability and ease of use. The versatility qualifies the stations not only for high volume quality assurance, but also for demanding development applications. This qualification helps to differentiate well-working devices from the ones with mediocre performance. In this way, unnecessary processing of low-quality devices is avoided early and possible problems during wafer production will be determined. NanoTest-W characterizes the optical and electrical behavior of VCSEL or Silicon Photonics chips on wafer level, while NanoTest-C is used for laser diodes, receivers and passive devices on bar or chip level.

Eine Netzsimulationsanlage ist in der Lage, alle bekannten Netzspannungen von 1 Ph. 110V bis 3 Ph. 1000V und auch die Netzfrequenzen 50 und 60 Hertz sinusmäßig nachzubilden. Netzsimulationsanlagen: Eine Netzsimulationsanlage ist in der Lage, alle bekannten Netzspannungen von 1 Ph. 110V bis 3 Ph. 1000V und auch die Netzfrequenzen 50 und 60 Hertz sinusmäßig nachzubilden. So können Sie Ihre Maschinen mit nationaler und internationaler Ausrichtung in Ihrem Werk prüfen und testen. Anwendungsbeispiele: •Maschinenbau •Haushaltsgeräte •Laborausrüstungen •Testen von: Kompletten Maschinen und Anlagen bis zu 630 KW

Due to the individual speed control, the Roots pumps of the innovative HiLobe® series offer a nominal pumping speed range of 520 - 2,100 m³/h and can be perfectly adjusted to customer-specific requirements. In general, Roots pumps need a backing pump adapted to the gas flow and which is suitable for the application in order to operate. pumping speed range:520 – 2,100 m³/h Integral leak rate:1 · 10^-6 Pa m³/s Nominal power at maximum speed:2 – 3.5 kW

Reliable Opto-Electronic Characterization for DC and RF Values The opto-electronic test station NanoTest PIC HD complies with all requirements for the testing of high-density photonics integrated circuits, such as silicon photonics structures or active PICs. Probe cards with up to several hundreds of contacts provide the connection for DC and RF measurements.

NanoHybrid provides a large degree of versatility. The active alignment, test and assembly station combines various assembly methods including gluing, laser welding or selective laser soldering. In addition, the station offers opto-electronic testing capability. Therefore, NanoHybrid is ideally suited for the development and small serial production in manufacturing companies or in research institutes. In such a product development area, an active alignment station needs to cope with opto-electronic and other precision devices with varying sizes and characteristics.

NanoTest VCSEL measures VCSEL on wafer level or Chip on Carrier regarding their optical and electrical characteristics. The tester accommodates wafers with a diameter of up to 6 inches (150 mm), as an option also larger diameters can be integrated. A special interface mounted to the chuck also allows for testing Chip on Carrier devices.A high-precision motion system with XYZ and rotary adjustment brings the wafer chuck in the respective measurement position. First, electrical contacting takes place supported by a sideview camera. A high-precision current source delivers the operating current for the VCSEL under test.

La velocidad importa en la inspección, el control de procesos o el análisis de defectos y fallos en la industria de la microelectrónica y los semiconductores. Cuanto más rápido detecte un defecto, más rápido podrá reaccionar. Con un gran campo visual, el sistema de inspección DM3 XL permite a su equipo identificar defectos más rápidamente y aumentar su tasa de rendimiento. Haga uso del campo visual aumentado un 30 % del exclusivo objetivo macro. El DM3 XL utiliza iluminación LED para todos los métodos de contraste. La iluminación LED proporciona una temperatura de color constante y ofrece imágenes a color reales en todos los niveles de intensidad. - Aumente su rendimiento - Detecte de manera fiable el revelado insuficiente en el borde o en el centro de la oblea - Detecte los espesores radiales de capa irregulares - Captura y procesamiento de imágenes a color realistas en todos los niveles de intensidad - Resultados reproducibles